• Spectroscopic ellipsometry on small optical fibers and waveguides with lateral resolution down to 1µm
• Precise refractive index measurement on waveguides, vertical facets and fiber ends with relative refractive index difference < 0.001
• Precise film thickness measurement with 0.1nm thickness resolution
• Wavelength range 190nm - 1700nm (IR upgrade to 2700nm possible)
• Multiple results from a single measurement: Film thickness, refractive index, composition, contaminations
• ECM mode (Ellipsometric Contrast enhanced Microscopy) for fast quality control

Typical applications include:

• Photonics and waveguides
• Integrated photonics
• Vertical facets
• Optical fibers