Funke et al (2021) - Determining the Dielectric Tensor of Microtextured Organic Thin Films by Imaging Mueller Matrix Ellipsometry

This paper impressively shows the unique benefits of the extensive use of Imaging Mueller Matrix Ellipsometry.

Do not miss this fantastic read!

(Paper by Prof. Manuela Schiek, Prof. Frank Balzer and Prof. Kurt Hingerl in cooperation with the Accurion application team)