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What is unique about an imaging ellipsometer?

  • Spectroscopic ellipsometric measurements on flakes of 2D-materials with sizes down to 1µm
  • Microscopic maps of thickness distribution and refractive indices from 190-1700nm
  • Ellipsometric contrast micrographs (ECM) enable increased contrast imaging over e.g. optical microscopy to visualize layer numbers and inhomogeneities
  • Non-destructive measurements on transparent substrates using knife edge illumination to prevent unwanted backside reflections

Advantages of imaging ellipsometry over other techniques

Imaging spectroscopic ellipsometry can be applied to characterize graphene and other 2D-materials. CVD grown, exfoliated and epitaxially grown flakes of 2D-materials are analyzed with the imaging ellipsometer ep4.

  • Imaging of monolayers on different substrates

  • Determination of the optical dispersion

  • Distinction between mono-, bi- or n-layers

  • Automatic flakesearch algorithm for identification of monolayers or well-defined thickness regions

  • Exploration of heterostructures

  • Quality control by detecting defects and special aspects of 2D nanoplates

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