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Thin Film Characterization

Lateral resolution down to 1 µm

Since 1991, Accurion has become the leader in Imaging Ellipsometry and Brewster Angle Microscopy. Our main expertise is to combine optical surface analysis with microscopy. This enables contactless characterization of surfaces and thinnest films on microscopic features, such as MEMS, Microfluidics, Bio-arrays, OLED pixel and many more.

Our systems have been used for new applications like Graphene and 2D materials, inkjet printing, integrated photonics and waveguides, lipid layers etc. and their number is increasing.

The modularity of the systems and the large number of accessories allow usage in scientific research as well as integrated devices for production lines.